Featured
Standard Delay Format
SDF file is how you represent your circuit delays. We have earlier seen SPEF format which is the circuit’s RC representation. SDF now has the delay numbers derived from these… Read more »
UGC NET: Effective Mass
A particle’s effective mass (often denoted m* is the mass that it seems to have when responding to forces, or the mass that it seems to have when interacting with other identical particles in a thermal distribution. …. Read more »
UGC NET: Intrinsic and Extrinsic Semiconductors
A semiconductor material in its pure form is called an intrinsic semiconductor. To be classified thus, its impurity content should be less than 1 part in 100 million parts of… Read more »
UGC NET: Bandgap
In the Energy band image above, there are certain energy ranges where no electron states can exist. e.g. Between band1 and band2, there is a range of energy states which… Read more »
UGC NET: Energy Bands in Solids
The electrons in a free atom can only have discrete energy levels. An electron farthest from the nucleus has the highest energy. The farther the electrons are, less the energy… Read more »
UGC NET : Introduction to Semiconductor
Semiconductors can be considered as materials that have an electrical conductivity ranging between that of an insulator like glass and a good conductor like metal. These group of materials like… Read more »
ESD III – Latent ESD Damage
ESD events sometimes doesn’t immediately destroy the devices but leaves a “latent defect”. This can cause a device failure later. Latent defects are not caught while testing as the device… Read more »
ESD II : ESD Protection Device
The principle of ESD protection devices is based on clamping the input voltage to a level that is safe for the IC to handle. In the circuitry given using Zener… Read more »
Electrostatic Discharge – I
ESD is something we come across in normal life, from lightning to the sudden shock experienced while touching certain materials. We however are interested more in the electronic kind, which… Read more »
OCV & AOCV
Process variation is a naturally occuring variation in the attributes of transistors(length, widths, oxide thickness) when integrated circuits are fabricated. These variations can be: Chip-to-chip There can be parameter difference… Read more »
Utility awk – Basics
The awk is a utility developed by Aho, Weinberger and Kerninghan (AWK). It is a pattern scanning and processing language.By default it reads from standard input and writes to standard… Read more »